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DanaFosmer.com - Test Engineering ArticlesArticles related to electrical Test Engineering.
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Articles related to electrical Test Engineering.
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DanaFosmer.com - Test Engineering Articles | danafosmer.com Reviews
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Articles related to electrical Test Engineering.
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Blog Archives - DanaFosmer.com
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How to create a trace graph display in LabVIEW using an Agilent U2001A power sensor. To determine how to create the trace graph display I used the U2001A programming guide. And the U2000 Series Labview driver from NI. The Agilent programming guide provides the example code, shown in Figure 1, to create a trace graph display. Figure 1. Example code for creating a trace graph display from the Agilent programming guide. Figures 2 and 3 show the LabVIEW code. The actual code. Figure 4. Read Trace.vi. One str...
Debugging Part 2 - DanaFosmer.com
https://www.danafosmer.com/test-engineering-articles/debugging-part-2
I have previously written about debugging. But that was more of a high-level abstract view. I think this is really important topic for test engineers and engineers in general. I am often disappointed in my own debugging skills, but also I have met very few people who are very good at it either. A tool I’ve been trying to use a lot for debugging lately is the Microsoft program OneNote. OneNote is great and I try to use it to write everything down. Figure 1. First segment of debugging session in OneNote.
Another New (Old) Role - DanaFosmer.com
https://www.danafosmer.com/test-engineering-articles/another-new-old-role
Another New (Old) Role. I have changed roles again. I'm back working as a test engineer. What happened was, the electronics packaging department and the test engineering department fell under the same larger department. I kept getting more involved in test engineering projects and less in packaging projects. So, with my management we decided it would make more sense if I just moved officially to the test engineering department. Your comment will be posted after it is approved.
Labview PXI Programming Part 2: DAQ - DanaFosmer.com
https://www.danafosmer.com/test-engineering-articles/labview-pxi-programming-part-2-daq
Labview PXI Programming Part 2: DAQ. I have previously written about how to do some basic things with the PXI instruments I have been working with lately. While I covered using the DAQ to generate and acquire analog signals, I would like to expand on what I wrote there. The NI PXIe 6259 M-series DAQ has three kinds of pins, or physical channels, as NI calls them. There are analog I/O, digital I/O and counter pins. The pins are setup like this. 32 analog inputs (ai0…ai31). 4 analog outputs (ao0…ao3).
Blog Posts - DanaFosmer.com
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Statistics for Test Engineers: Process Capability Index. When applying test limits to a measurement a design engineer (or someone with more knowledge of the circuit in question) may have an idea of what those limits should be, or they may just be offering a suggestion, making an approximate estimate. One such process capability index is the Cpk statistic. Here is the formula for Cpk. The little hats just mean that these are estimates. Figure 1. Measurement of a 5 V power supply repeated 20 times. Figure ...
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Bookshelf | OnTestEngineering
https://testview.wordpress.com/bookshelf
Information and Best Practices on the Testing of Manufactured Electronics and Systems. If you’re interested in learning more about test engineering here are some great books that have helped me. I particularly want to thank Brendan and Patrick for answering my questions on test and economics. Much of the information in their books can’t be found anywhere else and is presented in a very practical way uniquely applicable to Test. The Economics of Automatic Testing, 2nd Edition 1994, by Brendan Davis. The P...
The Effect of Power and Confidence in Electronics Testing | OnTestEngineering
https://testview.wordpress.com/2015/07/10/the-effect-of-power-and-confidence-in-electronics-testing
Information and Best Practices on the Testing of Manufactured Electronics and Systems. How Accurate Does Your Measurement Need to Be? The Effect of Power and Confidence in Electronics Testing. July 10, 2015. H0 = observe samples from a population with no defect or faults. Next we need to form an Alternative Hypothesis which must be measurable and mutually exclusive from H0 so that if one can occur the other cannot. This is referred to as Ha. These sample observations must come from some cause. Next we ne...
Fault Coverage | OnTestEngineering
https://testview.wordpress.com/fault-coverage
Information and Best Practices on the Testing of Manufactured Electronics and Systems. Maximizing fault coverage plays an important role in test engineering. Fault coverage may be defined as the ratio of detectable faults to the total number of faults . Since no single technology exists for obtaining 100% coverage of all faults we must work to adopt a strategy that provides the most economical level of coverage as early in the process as possible using a combination of technologies. The only change I’ve ...
Articles | OnTestEngineering
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Information and Best Practices on the Testing of Manufactured Electronics and Systems. Manufacturing Test Principles.pdf. The Relationship Between Quality, Fault Coverage and Yield. PCBA Test Flow Economics – Part I. PCBA Test Flow Economics – Part II. Functional Test View of Fault Coverage. 3 Sources of Manufacturing Defects. How to Read the Lean Time Chart. Pingback: A Study of Queuing Behavior in Continuous Flow Processes « OnTestEngineering. Leave a Reply Cancel reply. Enter your comment here.
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All things related to Spanish food, wine, and travel. Another Year, Another Trip to Spain. Why do I always leave packing until the last minute? At least my Kindle has plenty of stuff to read and my iPod has enough of The National to keep me from wanting to gouge my eyes out after 6 hours of B-movies and Kardashians re-runs that they’ll probably be screening on the plane. See you in Madrid! This entry was posted in Uncategorized. And tagged spain 2012. August 27, 2012. El tiempo vuela…. And tagged a peroxa.
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DanaFosmer.com - Test Engineering Articles
TestStand - Instrument Handles Update. 8203;I wanted to add something related to my last post. Since I wrote those posts on TestStand I have been through a lot of pain with TestStand and have gained a lot of new experience. The source of the pain has been trying to deploy some TestStand systems into our manufacturing environment. I ran into a problem with the specific technique of providing an alias to an instrument and using it in a deployed system. Figure 1. Example of using "Find VISA Resource" VI.
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A journal of fotos and other things. . . Monday, March 9, 2009. I've moved my blog to www.danachen.com. 0 comments leave a comment. Subscribe to: Posts (Atom). View my complete profile.
danafoto.de | Die persönliche Webseite der Fotografin Dana Anders
Willkommen bei danafoto - der persönlichen Webseite von Dana Anders. Sie können sich mein Portfolio ansehen oder Beiträge von den Turnieren dieser Welt unter der Rubrik "Tennis Heute" lesen. schließen. Wer wir sind und was wir tun. Als Fotojournalistin und Fotografin sind Fotos meine Kernkompetenz. Ich habe 35 Jahre Berufserfahrung als Bildjournalistin. Im Moment bin ich freiberuflich tätig. Schreiben Sie mich gerne für interessante Projekte an. Was ist mein Job? Warum gibt es diese Webseite? Folgen Sie ...
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Danafoto's | "Fotografując staraj się pokazać to, czego bez ciebie nikt by nie zobaczył." – Robert Bresson
Fotografując staraj się pokazać to, czego bez ciebie nikt by nie zobaczył. – Robert Bresson. Pierwsze próby spojrzenia w skali kosmicznej. Fotka o zachodzie słońca tzw. „niebieska godzina”. Już bez koloru, godzina po zachodzie słońca. Stanęło mi na drodze zwierzę i … szybko uciekło. On 10 Lipiec 2015. Czasem na zdjęciu odkrywamy coś czego nie widzieliśmy fotografując. On 10 Lipiec 2015. Moja wiosna w tym roku z małym opóźnieniem. On 10 Lipiec 2015. ZAĆMIENIE 20 marca 2015. Szkoda że u nas tylko częściowe.
