spm-cmmp.blogspot.com
CMMP Scanning Probe Microscopy: Flattening & Flattening Artifacts
http://spm-cmmp.blogspot.com/2011/06/flattening-flattening-artifacts.html
CMMP Scanning Probe Microscopy. Thursday, June 30, 2011. Flattening and Flattening Artifacts. AFM images generally require some post-processing. One method of post-processing is flattening. In this case a polynomial of order n. Is fit and subtracted from every trace and retrace. It is called "flattening" because this method of processing tends to flatten or unroll an AFM image. It is also a potential source of artifacts. To remedy these artifacts stop bands. Grains on a film surface. In these applica...
spm-cmmp.blogspot.com
CMMP Scanning Probe Microscopy: Magnetic Force Microscopy
http://spm-cmmp.blogspot.com/2011/06/magnetic-force-microscopy.html
CMMP Scanning Probe Microscopy. Monday, June 20, 2011. The force exerted on a dipole is the dot product of the dipole moment and the gradient of the field at the surface. In magnetic force microscopy. MFM- these dipole magnetic forces are detected as a change in cantilever phase and amplitude a finite distance above the surface. In an MFM image, the tip is tapped on the surface. To measure the surface morphology, and then rescanned across the surface 50-150 nm above the surface. Fast MFM in Contact Mode.
ellip-cmmp.blogspot.com
CMMP Ellipsometry: Gaertner Ellipsometer
http://ellip-cmmp.blogspot.com/2011/06/gaertner-ellipsometer.html
Friday, June 17, 2011. The CMMP group at the Florida State University Department of Physics has a Gaertner L116B ellipsometer that is available to the local research community. There are no fees for use of this instrument. Fast; non-contact; cost; ideal for Si oxides and nitrides; ideal for materials with well known optical properties for HeNe visible radiation. Subscribe to: Post Comments (Atom). View my complete profile. CMMP Scanning Electron Microscopy. CMMP Scanning Probe Microscopy.
mt-cmmp.blogspot.com
CMMP Magneto-Transport
http://mt-cmmp.blogspot.com/2013/10/these-are-optical-photos-of-ppms.html
Friday, October 25, 2013. These are optical photos of the PPMS resistivity pucks. The CMMP group has three of these so that samples can be contacted while one is in the system. Each puck has three stations that include four contacts for transport measurements. These contacts can be accessed either by our break-out box or the PPMS controller's resistivity bridge depending upon the application. Contacting samples is an art, and CMMP will not do that for you. The availability of three sets of contacts, labe...
overview-cmmp.blogspot.com
CMMP User Facilities: October 2014
http://overview-cmmp.blogspot.com/2014_10_01_archive.html
Wednesday, October 1, 2014. Because of staffing limitations at the CMMP facility, services requiring CMMP staff may involve some delay as instruments and staff time become available. In general, services are provided on a first-come, first server basis. This rule is subject to the discretion of the facility manager according to the availability of instrumentation, staffing, etc. The entries in italics. Are set as high priority, and the projects in red. Are either currently underway or scheduled.
overview-cmmp.blogspot.com
CMMP User Facilities: June 2013
http://overview-cmmp.blogspot.com/2013_06_01_archive.html
Sunday, June 30, 2013. Users of the CMMP facilities are requested to recognize the Florida State University Department of Physics Condensed Matter and Material Physics (CMMP) user facility in publications using this lab as a resource. While journal article co-authorship is not required to use the CMMP facilities, please consider offering co-authorship to CMMP staff contributing beyond the scope of routine instrument training and consultation. Subscribe to: Posts (Atom). View my complete profile.
overview-cmmp.blogspot.com
CMMP User Facilities: Introduction
http://overview-cmmp.blogspot.com/2012/04/introduction.html
Friday, July 5, 2013. Vibrating sample magnetometry, dielectric spectroscopy. And PPMS for magneto-transport measurements. Scanning electron microscopy (SEM with EDS). Scanning probe microscopy (SPM). X-ray photoelectron spectroscopy (XPS). Scanning probe microscopy (SPM). Evaporation, sputtering, UHV sputtering. Dip-pen nanolithography (DPN), photolithography, e-beam lithography, wet etching, reactive ion etching (RIE), ion milling, plasma etching, wire bonder, class 1000 cleanroom.
squid-cmmp.blogspot.com
CMMP SQUID Magnetometry: SQUID Drift
http://squid-cmmp.blogspot.com/2011/07/squid-drift.html
Tuesday, July 5, 2011. The SQUID profiles- the SQUID device output voltage vs. Extraction distance- are generally detrended. To remove any background on the SQUID profile. This occurs automatically, but one can inspect the raw SQUID voltages through the diagnostic menus of the MultiVu software. It is not unusual to see the SQUID voltage run through its output range repeatedly as the SQUID amplifier's gain is reset again and again. This is due the effect of SQUID drift. Shows M vs. t. For the magnet being...
spm-cmmp.blogspot.com
CMMP Scanning Probe Microscopy: Tapping AFM of Buckypaper
http://spm-cmmp.blogspot.com/2011/06/tapping-afm-of-buckypaper.html
CMMP Scanning Probe Microscopy. Tuesday, June 21, 2011. Tapping AFM of Buckypaper. This image is a tapping AFM image performed on a Buckypaper sample made of carbon nanotube bundles precipitated into a fibrous paper. Even though the system consists of free-standing fibers with very deep pores, it could be easily imaged. Subscribe to: Post Comments (Atom). Plane Fitting and Bow Artifacts. Flattening and Flattening Artifacts. Image Artifact: Self-Similar Triangles. Fast MFM in Contact Mode.
