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Nicole Rowsey

PhD Candidate, University of Florida, Electrical Engineering, Expected May 2012. BSE, Princeton University, Electrical Engineering, 2006. I am a Ph.D. student in Electrical Engineering studying semiconductor device reliability at the University of Florida. My research. Focuses on modeling two semiconductor reliability effects with related physics: total ionizing dose (TID) radiation effects and negative bias temperature instability (NBTI). You can check out my publications.

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Nicole Rowsey | nicolerowsey.com Reviews

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PhD Candidate, University of Florida, Electrical Engineering, Expected May 2012. BSE, Princeton University, Electrical Engineering, 2006. I am a Ph.D. student in Electrical Engineering studying semiconductor device reliability at the University of Florida. My research. Focuses on modeling two semiconductor reliability effects with related physics: total ionizing dose (TID) radiation effects and negative bias temperature instability (NBTI). You can check out my publications.

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Nicole Rowsey | nicolerowsey.com Reviews

https://nicolerowsey.com

PhD Candidate, University of Florida, Electrical Engineering, Expected May 2012. BSE, Princeton University, Electrical Engineering, 2006. I am a Ph.D. student in Electrical Engineering studying semiconductor device reliability at the University of Florida. My research. Focuses on modeling two semiconductor reliability effects with related physics: total ionizing dose (TID) radiation effects and negative bias temperature instability (NBTI). You can check out my publications.

INTERNAL PAGES

nicolerowsey.com

1

Interests - Nicole Rowsey

http://www.nicolerowsey.com/home/interests

My research interests include 3D device modeling (TCAD) and TCAD development, radiation-induced oxide defects and their effect on long-term device degradation, multi-gate device design, and MOS-based qubit candidate structures. Occasionally, when I'm not working, I enjoy juggling at the University of Florida. Or volunteering with MOTIV8. A mentoring program for at-risk middle school children.

2

Publications - Nicole Rowsey

http://www.nicolerowsey.com/home/publications

CONFERENCE AND JOURNAL PAPERS. A quantitative model for ELDRS and H. Degradation effects in irradiated oxides based on first principles calculations. N L Rowsey, M. E. Law, R. D. Schrimpf, D. M. Fleetwood, B. R. Tuttle, and S. T. Pantelides. IEEE NSREC'11, Las Vegas, NV. To be published in IEEE Trans. Nucl. Sci. Radiation-Induced oxide charge in low- and high-H2 environments. N L Rowsey, M. E. Law, R. D. Schrimpf, D. M. Fleetwood, B. R. Tuttle, and S. T. Pantelides. RADECS'11, Sevilla, Spain.

3

Resume - Nicole Rowsey

http://www.nicolerowsey.com/home/resume

PhD Candidate, University of Florida,. Electrical Engineering, Expected May 2012. Research Area: TCAD Modeling of Radiation-Induced Device Degradation. Thesis: TID Reliability Effects in Device SiO. Layers (Mark Law, Advisor). BSE Princeton University,. Electrical Engineering, 2006. Concentration: Solid State Physics / Devices. Minors: Engineering Physics, Music Performance. Sandia National Laboratories, Jun-Aug 2009. Research Intern for Rick Muller, Multiscale Dynamic Materials Modeling, Albuquerque, NM.

4

CV - Nicole Rowsey

http://www.nicolerowsey.com/home/cv

PhD Candidate, University of Florida, Electrical Engineering, Expected May 2012. BSE, Princeton University, Electrical Engineering, 2006. Device reliability and radiation effects modeling. Mark Law (chair), Jerry G. Fossum, Toshikazu Nishida, and Brent Gila. Conference and Journal Papers. A quantitative model for ELDRS and H. Degradation effects in irradiated oxides based on first principles calculations. IEEE NSREC'11, Las Vegas, NV. To be published in IEEE Trans. Nucl. Sci. RADECS'11, Sevilla, Spain.

5

Nicole Rowsey

http://www.nicolerowsey.com/home

PhD Candidate, University of Florida, Electrical Engineering, Expected May 2012. BSE, Princeton University, Electrical Engineering, 2006. I am a Ph.D. student in Electrical Engineering studying semiconductor device reliability at the University of Florida. My research. Focuses on modeling two semiconductor reliability effects with related physics: total ionizing dose (TID) radiation effects and negative bias temperature instability (NBTI). You can check out my publications.

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Nicole Rowsey

PhD Candidate, University of Florida, Electrical Engineering, Expected May 2012. BSE, Princeton University, Electrical Engineering, 2006. I am a Ph.D. student in Electrical Engineering studying semiconductor device reliability at the University of Florida. My research. Focuses on modeling two semiconductor reliability effects with related physics: total ionizing dose (TID) radiation effects and negative bias temperature instability (NBTI). You can check out my publications.

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