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RREACT - Reliability and Radiation Effects on Advanced CMOS Technologies

Reliability and Radiation Effects on Advanced CMOS Technologies. If we knew what we were doing, it wouldn't be called research. Electrical Stress, ESD, and Radiation. Is everywhere. You may not know, but every object at sea level is constantly bombarded by a shower of high-energy neutrons. And you can’t fly away from radiation: the particle flux is far more intense at avionics altitude, and space is one of the worst place you can think of, as far as radiation is concerned. 25-297.2011 Nuclear and Spa...

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RREACT - Reliability and Radiation Effects on Advanced CMOS Technologies | rreact.dei.unipd.it Reviews

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Reliability and Radiation Effects on Advanced CMOS Technologies. If we knew what we were doing, it wouldn't be called research. Electrical Stress, ESD, and Radiation. Is everywhere. You may not know, but every object at sea level is constantly bombarded by a shower of high-energy neutrons. And you can’t fly away from radiation: the particle flux is far more intense at avionics altitude, and space is one of the worst place you can think of, as far as radiation is concerned. 25-297.2011 Nuclear and Spa...

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2 a einstein

3 home page

4 our research

5 tutorials

6 radiation environments

7 see and tid

8 soft errors

9 gate oxide breakdown

10 nbti

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RREACT - Reliability and Radiation Effects on Advanced CMOS Technologies | rreact.dei.unipd.it Reviews

https://rreact.dei.unipd.it

Reliability and Radiation Effects on Advanced CMOS Technologies. If we knew what we were doing, it wouldn't be called research. Electrical Stress, ESD, and Radiation. Is everywhere. You may not know, but every object at sea level is constantly bombarded by a shower of high-energy neutrons. And you can’t fly away from radiation: the particle flux is far more intense at avionics altitude, and space is one of the worst place you can think of, as far as radiation is concerned. 25-297.2011 Nuclear and Spa...

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rreact.dei.unipd.it

1

RREACT - Links

http://rreact.dei.unipd.it/Resources/links.html

Reliability and Radiation Effects on Advanced CMOS Technologies. Electrical Stress, ESD, and Radiation. In these page you'll find web resources on the following topics:. Radiation Effects @ Semiconductor Companies. Page on soft errors. Measurement and reporting of alpha particle and terrestrial cosmic ray-induced soft errors in semiconductor devices. Software for the simulation of ion transport in matter. ITRS 2007: Process Integration, Devices, and Structures. Atmospheric radiation model by QinetiQ.

2

RREACT - Student Section

http://rreact.dei.unipd.it/students.html

Reliability and Radiation Effects on Advanced CMOS Technologies. Electrical Stress, ESD, and Radiation. Our group offers excellent opportunities for challenging theses on a number of different subjects. And if you want to become a Ph.D. student, we are always looking for talented young people, who enjoy science and research. The best way to start working with the RREACT group is to get to know our research. To help you with that. Developing physical models of degradation and radiation effects.

3

RREACT - Channel Hot Carriers Tutorial

http://rreact.dei.unipd.it/Tutorials/channel_hot_carriers.html

Reliability and Radiation Effects on Advanced CMOS Technologies. Electrical Stress, ESD, and Radiation. Channel Hot Carriers may be a serious concern, since they heavily alter the characteristics of MOSFETs. When the lateral field of MOSFET is significantly high, carriers coming from the channel can be heated in the pinch-off energy and acquire enough momentum to be injected in the gate oxide. This may lead to changes in the threshold voltage and mobility decrease. Department of Information Engineering.

4

RREACT - Facilities

http://rreact.dei.unipd.it/facilities.html

Reliability and Radiation Effects on Advanced CMOS Technologies. Electrical Stress, ESD, and Radiation. Here's a list of the facilities we use for our experiments. State-of-the-art testing equipment for accurate measurements down to the fA in our laboratory at the Department of Information Engineering, University of Padova, Italy. Heavy-ion beam line dedicated to single event effects testing, located at the INFN Laboratori Nazionali di Legnaro, Padova, Italy. Heavy-ion beam line in Jyväskylä, Finland.

5

RREACT - Collaborations

http://rreact.dei.unipd.it/collaborations.html

Reliability and Radiation Effects on Advanced CMOS Technologies. Electrical Stress, ESD, and Radiation. Over the years, we collaborated with many companies and research institutions all over the world. Department of Information Engineering.

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RREACT - Reliability and Radiation Effects on Advanced CMOS Technologies

Reliability and Radiation Effects on Advanced CMOS Technologies. If we knew what we were doing, it wouldn't be called research. Electrical Stress, ESD, and Radiation. Is everywhere. You may not know, but every object at sea level is constantly bombarded by a shower of high-energy neutrons. And you can’t fly away from radiation: the particle flux is far more intense at avionics altitude, and space is one of the worst place you can think of, as far as radiation is concerned. 25-297.2011 Nuclear and Spa...

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